Welcome to Precision Analytical Laboratory's knowledge area where we share a little of what we know about cleanliness testing and related issues. On this page you will find presentations on the most utilized residue analysis techniques and cleanliness related topics. If you have questions or would like to discuss a cleanliness testing need, please contact us.


Description (Component Cleanliness - Should Industry Care?):  Joe presented this short study to the IPC Reliability Forum in April 2017. In this study, the researchers set out to baseline the starting cleanliness of different sized Ball Grid Arrays (BGA's) using industry standard tests and to re-evaluate the cleanliness after the BGA's were sent through state-of-the-art re-balling procedures. The tests performed included the Resistivity of Solvent Extract (ROSE) per the GEIA-STD-0006 and the Ion Chromatography (IC) test per IPC-TM-650, method 2.3.28 (Currently there are no industry cleanliness criteria for components when evaluated by IC testing).  Initially, the baseline test of the BGA's was performed using Ion Chromatography testing. The results from the two tests after re-balling suggested the need for a discussion about how we measure part cleanliness and so our premise changed from "Should Industry Care" to "Its Time to Improve Component Standards and Measurement".  

Description (Chemical Data vs. Electrical Data: Is One a Better Reliability Predictor):  The goal of this study was to correlate IPC Chemical and Electrical Conductive Anodic Filament (CAF) test results. 

SMTAI Presentation 2016 Revised 10-24-16.pdf SMTAI Presentation 2016 Revised 10-24-16.pdf
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Description (HI-REL Conference Presentation):  This presentation gives an overview of the different testing techniques currently being used in industry for evaluating cleanliness.   

Description (Joe Midwest 2009 Presentation):  In this presentation Joe provides an analysts perspective into tracking down cleanliness related failures. 

Joe Midwest 2009 Presentation.pdf Joe Midwest 2009 Presentation.pdf
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Description (Joe Russeau Midwest 2010 Presentation): This presentation is similar to the HI-REL presentation in terms of the content, but with added case studies.  

Joe Russeau Midwest 2010.pdf Joe Russeau Midwest 2010.pdf
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Description (Cleaning in an HDI World 2-29-12):  This presentation is a collaborative research effort for developing a better "Mouse Trap" for capturing cleanliness issues.  This effort is still on-going...

Cleaning in an HDI World 2-29-12 Final.pdf Cleaning in an HDI World 2-29-12 Final.pdf
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Description (Is Component Testing Using the ROSE Test Practical?) - August 2018: This EMSNow article is a presentation of collaborative research between Joe Russeau, Precision Analytical Laboratory and Mark Northrup, IEC Electronics.
Description (Is it Time to the ROSE Testing) - May 2018: This SMT007 article discusses why the ROSE test is an ineffective tool for testing "cleanliness" or for use as a "process control tool". Article by Joe Russeau, Precision Analytical Laboratory and Mark Northrup, IEC Electronics. The article begins on page 36
Is it Time to Retire ROSE Testing.pdf Is it Time to Retire ROSE Testing.pdf
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Description (Increasing Reliability Through Predictive Analysis):  Patty Goldman of I-Connect007 sits down with Joe to discuss the presentation "Chemical Data vs. Electrical Data: Is One a Better Reliability Predictor?" presented at SMTAI in 2016.  The article begins on page 80.
SMT Magazine - Nov2016.pdf SMT Magazine - Nov2016.pdf
Size : 18480.38 Kb
Type : pdf